NSG Group to use Bruker atomic force microscope

Equipped with Bruker’s self-optimizing ScanAsyst Imaging Mode and PeakForce TUNA module, the AFM system is designed for use in conductivity mapping as well as to characterize other difficult materials.

Bruker AFM Unit executive vice president and general manager David Rossi said the Dimension Icon is a large-sample AFM specifically designed to address atomic force microscopy needs of both the research lab and industrial applications.

"PeakForce TUNA and the rest of our new suite of products build on the foundation of PeakForce Tapping and ScanAsyst modes to provide non-destructive and artifact-free nanoelectrical and electrochemical characterization in the growing arena of future energy generation and storage materials," Rossi added.

NSG Group microscopy and surface analysis spokesperson Keith Arnold said the AFM capabilities and long-term performance of Dimension Icon will replace the company’s earlier vintage MultiMode AFM.

"The potential for higher throughput has been realized with Icon and eakForce TUNA and we are pleased with the options their current product now offers, particularly for our advanced materials R&D," Arnold added.